Analysis of asymmetric broadening of X-ray diffraction peak profiles caused by randomly distributed polarized dislocation dipoles and dislocation walls

Author(s) of this paper may load this reprint on their own web site provided that this cover page is retained. Republication of this article or its storage in electronic databases or the like is not permitted without prior permission in writing from the IUCr. The problem of asymmetric X-ray diffraction peak broadening caused by dislocations is investigated. The leading term responsible for the asymmetry of the intensity distribution is calculated for randomly distributed polarized dipoles and dipole walls. It is found that the polarization structure of a dislocation ensemble can be determined from the diffraction order dependence of the pro®le asymmetry.